top of page

ITRAX product overview

Game changing innovations first introduced
on the market with Itrax XRF scanners
  • XRF scanning close to the sample surface but without sample contact, for improved scanning speed and analytical quality.

  • Contact free measurement of sample topography by laser, for fast and detailed sample height profile.

  • Capacity to determine all chemical elements Na-U in one fast analysis and at one voltage with best sensitivity, and to distinguish between all these elements and to quantify them,  even all the REE metals.​

  • PolyflatTM X-ray beam guide technology, for higher speed of analysis, especially at small step sizes.

  • Dual x-ray energy excitation, for high sensitivity analysis of light as well as heavy elements simultaneously.

  • XRF scanning at different lateral step sizes with the same beam size, thereby achieving a slit free, high speed scanning solution for small increments.

  • Millimeter and sub-millimeter level increment XRF scanning down to 0.1 millimeter, for fine sample details.

  • XRF software for quantification of element concentrations based on fully featured Fundamental Parameter technique. This markedly improves quantitative measurements on cores, and also much extends the range of sample matrix compositions that one calibration standard covers. The result is that one calibration standard covers the calibration requirements for most mineral cores, regardless of matrix composition.

  • Borehole Viewer advanced data processing tool for display, evaluation and logging support of boreholes.


These innovative features were first introduced with the Itrax Core Scanner, starting in 2003.

Since then they have been integrated in our later instruments too, as these were introduced.

bottom of page