ITRAX product overview
Game changing innovations from Cox, for you to use with Itrax scanners
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Conduct XRF scanning without sample contact for faster and more accurate analytical results.
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Utilize laser technology for non-contact measurement of sample topography.
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Perform fast analysis of all chemical elements from Na to U, including difficult elements such as REE metals.
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Employ PolyflatTM X-ray beam guide technology for faster analysis
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Analyze both light and heavy elements with high sensitivity and precision in one fast analysis.
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Perform XRF scanning at any user selected increment size from meter to sub-millimeter.
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Implement high-speed scanning for small increments without the need for a capacity reducing slit.
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Benefit from XRF software that uses fully-featured Fundamental Parameter techniques to quantify element concentrations in one click, without need for calibration with other techniques.
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Allow for correct quantifications on a wide range of sample matrix compositions without re-calibrations
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Apply our advanced data processing tool to display, evaluate, and log borehole data with ease.