Conduct XRF scanning without sample contact for much faster scanning and more accurate analytical results.

Utilize laser technology for non-contact measurement of sample topography, to add XRF data quality and reproducibility.

Perform fast good sensitivity analyses of all chemical elements from Na to U, including difficult elements such as REE metals and other heavy elements.

Employ PolyflatTM X-ray beam guide technology for higher x-ray flux, leading to faster and more precise analyses

Analyze both light and heavy elements with high sensitivity and precision in one fast analysis.

Perform XRF scanning at any user selected increment size from centimeter to sub-millimeter with the same high speed and data quality per analytical point, regardless of selected analytical step size.

Get high-speed scanning for small increments without the need for a capacity reducing slit.

Benefit from XRF software that uses fully-featured Fundamental Parameter techniques to quantify element   concentrations in one click, without need to apply calibration using other techniques.

Have correct quantifications on a wide range of sample matrix compositions without re-calibrations

Apply our advanced data processing tool to display, evaluate, and log borehole data with ease.​