Game changing innovations first introduced by Cox, for you to use with Itrax scanners
-
Conduct XRF scanning without sample contact for much faster scanning and more accurate analytical results.
-
Utilize laser technology for non-contact measurement of sample topography, to add XRF data quality and reproducibility.
-
Perform fast good sensitivity analyses of all chemical elements from Na to U, including difficult elements such as REE metals and other heavy elements.
-
Employ PolyflatTM X-ray beam guide technology for higher x-ray flux, leading to faster and more precise analyses
-
Analyze both light and heavy elements with high sensitivity and precision in one fast analysis.
-
Perform XRF scanning at any user selected increment size from centimeter to sub-millimeter with the same high speed and data quality per analytical point, regardless of selected analytical step size.
-
Get high-speed scanning for small increments without the need for a capacity reducing slit.
-
Benefit from XRF software that uses fully-featured Fundamental Parameter techniques to quantify element concentrations in one click, without need to apply calibration using other techniques.
-
Have correct quantifications on a wide range of sample matrix compositions without re-calibrations
-
Apply our advanced data processing tool to display, evaluate, and log borehole data with ease.​