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Game changing innovations first introduced by Cox, for you to use with Itrax scanners
  • Conduct XRF scanning without sample contact for much faster scanning and more accurate analytical results.

  • Utilize laser technology for non-contact measurement of sample topography, to add XRF data quality and reproducibility.

  • Perform fast good sensitivity analyses of all chemical elements from Na to U, including difficult elements such as REE metals and other heavy elements.

  • Employ PolyflatTM X-ray beam guide technology for higher x-ray flux, leading to faster and more precise analyses

  • Analyze both light and heavy elements with high sensitivity and precision in one fast analysis.

  • Perform XRF scanning at any user selected increment size from centimeter to sub-millimeter with the same high speed and data quality per analytical point, regardless of selected analytical step size.

  • Get high-speed scanning for small increments without the need for a capacity reducing slit.

  • Benefit from XRF software that uses fully-featured Fundamental Parameter techniques to quantify element   concentrations in one click, without need to apply calibration using other techniques.

  • Have correct quantifications on a wide range of sample matrix compositions without re-calibrations

  • Apply our advanced data processing tool to display, evaluate, and log borehole data with ease.​

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