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ITRAX product overview

Game changing innovations first introduced
on the XRF scanner market with Itrax scanners
  • XRF scanning close to the sample surface, but without sample contact for improved scanning speed and analytical quality.

  • Contact free measurement of sample topography by laser, for fast and detailed sample height profile.

  • Capacity to determine all chemical elements Na-U in one fast analysis and at one voltage with best sensitivity, and to quantify all these elements,  even for difficult elements like the REE metals.​

  • PolyflatTM X-ray beam guide technology, for higher speed of analysis, especially at small step sizes.

  • Dual x-ray energy excitation, for accurate analysis of light as well as heavy elements simultaneously.

  • XRF scanning at different lateral step sizes with the same beam size, thereby achieving a slit free, high speed scanning solution for small increments.

  • Millimeter and sub-millimeter level increment XRF scanning down to 0.1 millimeter, for fine sample details.

  • XRF software for one-click quantification of element concentrations based on fully featured Fundamental Parameter technique. This markedly improves quantitative measurements on cores, and also much extends the range of sample matrix compositions that one calibration standard covers. The result is that one calibration standard covers the calibration requirements for most mineral cores, regardless of matrix composition.

  • Borehole Viewer advanced data processing tool for display, evaluation and logging support of boreholes.


When you compare XRF scanners of different makes and models, you will find that they perform differently in terms of e.g. sample throughput, as well as quality of, and technique for, quantitative analyses. The introduction of this list of performance improving, innovative Itrax features started in 2003.

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