ITRAX product overview

Game changing innovations introduced with Itrax scanners
  • XRF scanning close to the sample surface but without sample contact, for improved scanning speed.

  • Contact free measurement of sample topography by laser, for best scanning results.

  • Determination of all elements in one measurement and at one voltage with best sensitivity, for speed.

  • PolyflatTM X-ray beam guide technology, for higher speed and sensitivity.

  • Dual x-ray energy excitation for high sensitivity analysis of all elements simultaneously

  • XRF scanning at different lateral step sizes with the same beam size, thereby achieving a slit free, high speed solution for small increments.

  • Millimeter and sub-millimeter level increment XRF scanning down to 0.1 millimeter, for fine sample details.

  • XRF software for quantification of element concentrations based on Fundamental Parameter technique and dual x-ray energy excitation allowing for good estimates of absolute amounts of all detected elements.

  • Data display and evaluation tools like ReDiCore for data from one core at the time, and an advanced data processing tool like Borehole Viewer for display and analysis of a whole borehole.